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Structural Analysis of Materials

coursetab

c_weekno	Title	Body
1	Introduction to Microstructural Characterization
10	TEM II: types of information, image vs diffraction pattern
11	Types of analysis I: crystallography-SAED, Kikuchi pattern, EBSD, CBED
12	Types of analysis II: chemical element-EDS, WDS, XRF, AES, XPS, EELS
13	TEM III: bright field image, dark field image, diffraction pattern analysis
14	TEM IV: HRTEM, STEM, HADDF
15	TEM V: sample preparations
16	Intensive Structural Analysis: FIB, SPM, EXAFS, SANS, APFIM
2	Sources: property of light
3	Optical Microscope I: history, components, resolution
4	OM II: aberrations, various modes, record
5	OM III: sample preparations
6	Scanning Electron Microscope I: components, resolution, aberrations
7	SEM II: electron interaction, electron guns, electromagnetic lens
8	SEM III: detectors, magnification, image interpretation, disturbances
9	Transmission Electron Microscopy I: history, components, lens system

code:

445.333_2010S

level:

year:

term:

staff:

Prof. Park, Eun Soo

c_regdate:

2011-02-25 14:16:12

department:

Materials Science and Engineering